Tom Scherzer | nir | Galoá Proceedings

Near Infrared Spectroscopy: Proceedings of the International Conference

ISSN: 2447-3758

vol. 1, 2015

DOI 10.17648/nir-2015

Leibniz Institute of Surface Modification (IOM) - Chemical Department

Tom Scherzer

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Monitoring of the Degree of Condensation in Thin Alkoxysiloaxane Layers by NIR Reflection Spectroscopy
10. Petrochemical/Polymers

Tom Scherzer ¹ ; Gabriele Mirschel ¹ ; Ulrike Helmstedt ¹ ; Lutz Prager ¹ ; Ulrich Decker ¹

¹ Leibniz Institute of Surface Modification (IOM) - Chemical Department

vol. 1, 2015 -
31732

Co-authors (4)

Publications in other proceedings

nir-abstracts
Monitoring of the Degree of Condensation in Thin Alkoxysiloaxane Layers by NIR Reflection Spectroscopy