Optimizations of electronic stopping cross section measurements using the backscattering method

In this work, we present a contribution to ion beam analysis through a method designed to minimize the statistical and systematic uncertainties associated with the determination of the stopping power of matter for incident ions. Applied to the Rutherford Backscattering Spectrometry (RBS) technique, the method enables the visualization of how these uncertainties depend on the experimental setup, particularly on the scattering and incidence angles of the ion beam with respect to the target material. This prior estimation allows the selection of the optimal experimental configuration, leading to improved accuracy of the results. The method was applied to the determination of the stopping power of helium ions in a thin gold film, yielding average total uncertainties of 4.7% over a wide energy range. The results were evaluated against the predictions of the SRIM, DPASS, and ICRU-49 models, demonstrating that our approach improves the confidence interval of data obtained by the backscattering technique, thereby enhancing its applicability and reliability.