Tracks
- Material Science Analysis Using HRDP Methods
- Low and Medium Energy Ion Scattering
- Rutherford Backscattering, Elastic Recoil Detection
- Quantitative Analysis of Biological Surfaces and Interfaces
- Thin-film analysis and growth monitoring
- Nanostructured and semiconductor materials
- Synergies with complementary methods such as XPS, SIMS, and AFM
- Secondary Ion Mass Spectroscopy and Alternative Depth Profiling Methods
- Theoretical Developments and New Computer Simulations
- Surface and interface characterization at the atomic scale
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