Tom Scherzer | nir-abstracts | Galoá Proceedings

Leibniz Institute of Surface Modification (IOM) - Chemical Department

Tom Scherzer

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Monitoring of the Degree of Condensation in Thin Alkoxysiloaxane Layers by NIR Reflection Spectroscopy

Tom Scherzer ¹ ; Gabriele Mirschel ¹ ; Ulrike Helmstedt ¹ ; Lutz Prager ¹ ; Ulrich Decker ¹

¹ Leibniz Institute of Surface Modification (IOM) - Chemical Department

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Monitoring of the Degree of Condensation in Thin Alkoxysiloaxane Layers by NIR Reflection Spectroscopy