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HRDP 2026

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Book of abstracts of the 12th International Workshop on High Resolution Depth Profiling

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  • Material Science Analysis Using HRDP Methods
  • Nuclear Reaction Profiling with Atomic Layer Depth Resolution
  • Low and Medium Energy Ion Scattering
  • New Facilities and Instrumental Developments
  • Rutherford Backscattering, Elastic Recoil Detection
  • Ion Detection in Helium Ion Microscopy and Atom Probe Tomography
  • Quantitative Analysis of Biological Surfaces and Interfaces
  • Thin-film analysis and growth monitoring
  • Nanostructured and semiconductor materials
  • Emerging techniques for ultra-shallow depth profiling
  • Synergies with complementary methods such as XPS, SIMS, and AFM
  • Secondary Ion Mass Spectroscopy and Alternative Depth Profiling Methods
  • Theoretical Developments and New Computer Simulations
  • Surface and interface characterization at the atomic scale
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