Chikashi Yoshimoto | HRDP 2026 | Galoá Proceedings

National Institute for Materials Science

Chikashi Yoshimoto

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Development of Quantitative Stigmatic SIMS Imaging through Electron-Blooming Correction and Pixel-Wise Ion–Photon Response Calibration
C. Yoshimoto ¹
S. Itoh ²
¹ National Institute for Materials Science
² Kyoto University
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342416

Secondary Ion Mass Spectroscopy and Alternative Depth Profiling Methods

Oral talk
Quantitative and site-sensitive analysis of surface deuterium on TiO2(001) by low-energy ERDA
T. Suzuki ¹
C. Yoshimoto ¹
I. Sakaguchi ¹
S. Iimura ¹
T. Nishimura ²
B. Tsuchiya ³
¹ National Institute for Materials Science
² Hosei University
³ Meijo University
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342402

Low and Medium Energy Ion Scattering

Invited talk

Co-authors (6)