Role of temperature on the global response in the interface growth dynamics

An interesting problem in thin film science is a sudden change in the dynamics
during the interface growth. For instance, this is the case of
a change from sputtering to annealing in a cycle of surface
cleaning. Since erosion or dissolution are
frequently present in those processes, KPZ scaling was also
observed in films after high-temperature annealing,
with initial deposition by sputtering. Thus, the apparently
simple situation of a sudden change in the growth dynamics
may have a variety of applications that involve KPZ scaling.

The global response of the sudden changes in the interface growth dynamics
is discussed using models of the Kardar-Parisi-Zhang (KPZ) and
Villain-Lai-Das Sarma (VLDS) classes during their growth regimes in 2 + 1
dimensions.
We introduce scaling arguments and present simulation results to predict the
relaxation of the difference in the squared global roughness of the
perturbed and the unperturbed interfaces. Following the same lines
of previous works [1-3] discussed in previous talk, we propose an asymptotic
scaling which includes the temperature effects in the
scaling of the correlation length. Interestingly, our results indicate a
crossover from a dynamic where the plateau formation
prevails to a dynamic with the scaling of the correlation length of the
corresponding VLDS model [4].
Finally, we discuss our results making a parallel with experiments for KPZ-VLDS
case that may be viewed as a potential application [5].

[1] Y.-L. Chou, M. Pleimling, and R. K. P. Zia, Phys. Rev. E \textbf{80}, 061602 (2009)

[2] Y.-L. Chou and M. Pleimling, J. Stat. Mech. P08007 (2010)

[3] T. A. de Assis and F. D. A. Aar?o Reis, Phys. Rev. E \textbf{89}, 062405 (2014)

[4] F. D. A. Aar?o Reis, Phys. Rev. E \textbf{81} 041605 (2010)